An official website of the United States government
- Home
- Search Results
- Page 1 of 1
Search for: All records
-
Total Resources5
- Resource Type
-
0004000001000000
- More
- Availability
-
50
- Author / Contributor
- Filter by Author / Creator
-
-
Tulabandhula, Theja (4)
-
Stutts, Alex C. (3)
-
Trivedi, Amit Ranjan (3)
-
Erricolo, Danilo (2)
-
Ravi, Sathya (2)
-
Aggrawal, Himanshu (1)
-
Darabi, Nastaran (1)
-
Franklin, Rhonda (1)
-
Haj-Omar, Amr (1)
-
Harvey, Duane (1)
-
Henderson, Rashaunda (1)
-
Kahn, Ken (1)
-
Kornegay, Michel (1)
-
Parente, Domenico (1)
-
Pillay, Netra (1)
-
Rathore, Heena (1)
-
Samant, Abhay (1)
-
Shukla, Priyesh (1)
-
Stutts, Alex (1)
-
Stutts, Alex C (1)
-
- Filter by Editor
-
-
& Spizer, S. M. (0)
-
& . Spizer, S. (0)
-
& Ahn, J. (0)
-
& Bateiha, S. (0)
-
& Bosch, N. (0)
-
& Brennan K. (0)
-
& Brennan, K. (0)
-
& Chen, B. (0)
-
& Chen, Bodong (0)
-
& Drown, S. (0)
-
& Ferretti, F. (0)
-
& Higgins, A. (0)
-
& J. Peters (0)
-
& Kali, Y. (0)
-
& Ruiz-Arias, P.M. (0)
-
& S. Spitzer (0)
-
& Sahin. I. (0)
-
& Spitzer, S. (0)
-
& Spitzer, S.M. (0)
-
(submitted - in Review for IEEE ICASSP-2024) (0)
-
-
Have feedback or suggestions for a way to improve these results?
!
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
Parente, Domenico; Darabi, Nastaran; Stutts, Alex C.; Tulabandhula, Theja; Trivedi, Amit Ranjan (, IEEE)
-
Stutts, Alex C.; Erricolo, Danilo; Tulabandhula, Theja; Trivedi, Amit Ranjan (, IEEE)
-
Shukla, Priyesh; Sureshkumar, S.; Stutts, Alex C.; Ravi, Sathya; Tulabandhula, Theja; Trivedi, Amit R. (, IEEE)
-
Aggrawal, Himanshu; Franklin, Rhonda; Haj-Omar, Amr; Harvey, Duane; Henderson, Rashaunda; Kahn, Ken; Kornegay, Michel; Pillay, Netra; Rathore, Heena; Samant, Abhay; et al (, IEEE Microwave Magazine)
